OFERTA FORMATIVA DCM - FCT/UNL
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Nanofabrication Lab
Description:
This laboratory is equipped with a Scanning Electron Microscopy Focused Ion Beam (SEM-FIB) workstation, Atomic Force microscopy unit, confocal microscope and a tabletop microscope. It has also a contact angle instrument for automated video contact angle metrology and drop shape analysis, 2 profilometers that measure roughness and step height, optical microscope and optical stereo microscope.
This laboratory is equipped with a Scanning Electron Microscopy Focused Ion Beam (SEM-FIB) workstation, Atomic Force microscopy unit, confocal microscope and a tabletop microscope. It has also a contact angle instrument for automated video contact angle metrology and drop shape analysis, 2 profilometers that measure roughness and step height, optical microscope and optical stereo microscope.
Equipments:
