OFERTA FORMATIVA DCM - FCT/UNL

ยป Home

Biblio

Export 2 results:
Sort by: Author Title Type [ Year (Desc)]
Filters: Keyword is Bias voltage  [Clear All Filters]
2016
b Kiazadeh A a, c Gomes HL b, Barquinha P a, Martins J a, Rovisco A a, Pinto JV a, Martins R a, Fortunato E a.  2016.  Improving positive and negative bias illumination stress stability in parylene passivated IGZO transistors. Applied Physics Letters. 109 Abstract
Niang KM a, Barquinha PMC b, Martins RFP b, Cobb B c, Powell MJ d, Flewitt AJ a.  2016.  A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under positive gate bias stress. Applied Physics Letters. 108 Abstract